Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Material assessment for uni-axial strained Ge pMOS -1: characterization of GeSn(B) materials
Publication:
Material assessment for uni-axial strained Ge pMOS -1: characterization of GeSn(B) materials
Date
2010
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vincent, Benjamin
;
Shimura, Yosuke
;
Takeuchi, Shotaro
;
Nishimura, Tsuyoshi
;
Demeulemeester, Jelle
;
Eneman, Geert
;
Clarysse, Trudo
;
Vandervorst, Wilfried
;
Vantomme, Andre
;
Nakatsuka, Osamu
;
Zaima, Shigeaki
;
Dekoster, Johan
;
Caymax, Matty
;
Loo, Roger
Journal
Abstract
Description
Metrics
Views
1916
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1916
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations