Publication:
Centimetre-scale micro-transfer printing to enable heterogeneous integration of thin film lithium niobate with silicon photonics
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| cris.virtual.orcid | 0000-0002-5639-9300 | |
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| cris.virtualsource.orcid | ddf75a08-5f04-4872-9823-2c85f1f2db8c | |
| dc.contributor.author | Niels, Margot | |
| dc.contributor.author | Vanackere, Tom | |
| dc.contributor.author | Vandekerckhove, Tom | |
| dc.contributor.author | Poelman, Stijn | |
| dc.contributor.author | Reep, Tom | |
| dc.contributor.author | Roelkens, Gunther | |
| dc.contributor.author | Billet, Maximilien | |
| dc.contributor.author | Kuyken, Bart | |
| dc.contributor.imecauthor | Niels, Margot | |
| dc.contributor.imecauthor | Vanackere, Tom | |
| dc.contributor.imecauthor | Vandekerckhove, Tom | |
| dc.contributor.imecauthor | Poelman, Stijn | |
| dc.contributor.imecauthor | Reep, Tom | |
| dc.contributor.imecauthor | Roelkens, Gunther | |
| dc.contributor.imecauthor | Billet, Maximilien | |
| dc.contributor.imecauthor | Kuyken, Bart | |
| dc.contributor.orcidimec | Vanackere, Tom::0000-0003-4692-9467 | |
| dc.contributor.orcidimec | Vandekerckhove, Tom::0000-0002-5639-9300 | |
| dc.contributor.orcidimec | Poelman, Stijn::0000-0002-8374-1466 | |
| dc.contributor.orcidimec | Reep, Tom::0000-0002-5223-5480 | |
| dc.contributor.orcidimec | Roelkens, Gunther::0000-0002-4667-5092 | |
| dc.contributor.orcidimec | Billet, Maximilien::0000-0002-5784-5050 | |
| dc.contributor.orcidimec | Kuyken, Bart::0000-0002-8745-7833 | |
| dc.date.accessioned | 2025-03-09T19:31:45Z | |
| dc.date.available | 2025-03-09T19:31:45Z | |
| dc.date.issued | 2025 | |
| dc.description.abstract | The integrated photonics CMOS-compatible silicon nitride (SiN) platform is praised for its low propagation loss but is limited by its lack of active functionalities such as a strong Pockels coefficient and intrinsic χ(2) nonlinearity. In this paper, we demonstrate the integration of centimetre-long thin-film lithium niobate (TFLN) devices on a SiN platform using the micro-transfer printing (µTP) method. At a wavelength of 1550 nm, propagation losses of approximately 0.9 dB/cm and transition losses of 1.8 dB per facet were measured. Furthermore, the TFLN was integrated into an imbalanced push-pull Mach-Zehnder modulator, achieving a Vπ of 3.2 V. The electro-optic nature of the observed modulation is confirmed by measuring the device up to 35 GHz, showing that the printing does not affect the high-speed LN properties. | |
| dc.description.wosFundingText | Fonds Wetenschappelijk Onderzoek (40007560, 3G035722) ; HORIZON EUROPE European Innovation Council (101069447) . | |
| dc.identifier.doi | 10.1364/OME.551748 | |
| dc.identifier.issn | 2159-3930 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45363 | |
| dc.publisher | Optica Publishing Group | |
| dc.source.beginpage | 531 | |
| dc.source.endpage | 540 | |
| dc.source.issue | 3 | |
| dc.source.journal | OPTICAL MATERIALS EXPRESS | |
| dc.source.numberofpages | 10 | |
| dc.source.volume | 15 | |
| dc.subject.keywords | NITRIDE | |
| dc.subject.keywords | CIRCUITS | |
| dc.title | Centimetre-scale micro-transfer printing to enable heterogeneous integration of thin film lithium niobate with silicon photonics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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