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Conference contributions
Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation
Publication:
Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation
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Date
2021
Proceedings Paper
https://doi.org/10.23919/EuMIC50153.2022.9783630
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
ElKashlan, Rana Y.
;
Khaled, Ahmad
;
Rodriguez, Raul
;
Putcha, Vamsi
;
Peralagu, Uthayasankaran
;
Alian, AliReza
;
Collaert, Nadine
;
Wambacq, Piet
Journal
na
Abstract
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1391
since deposited on 2022-09-04
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Acq. date: 2025-12-13
Citations
Metrics
Views
1391
since deposited on 2022-09-04
1
last month
Acq. date: 2025-12-13
Citations