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Influence of temperature on the operation of strained triple-gate FinFETs
Publication:
Influence of temperature on the operation of strained triple-gate FinFETs
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Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pavanello, M.A.
;
Martino, J.A.
;
Simoen, Eddy
;
Rooyackers, Rita
;
Collaert, Nadine
;
Claeys, Cor
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1766
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations
Metrics
Views
1766
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations