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Structural characterization of improved GaN epilayers grown on a Ge(111) substrate
Publication:
Structural characterization of improved GaN epilayers grown on a Ge(111) substrate
Date
2011-08
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Yucheng
;
Fu, Wai-Yuan
;
Humphreys, Colin
;
Lieten, Ruben
Journal
Applied Physics Express
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1862
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations
Metrics
Views
1862
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations