Publication:

Effects of electron and proton radiation on embedded SiGe source/drain diodes

Date

2008
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorOhyama, H.
dc.contributor.authorNagano, T.
dc.contributor.authorTakakura, K.
dc.contributor.authorMotoki, M.
dc.contributor.authorMatsuo, M.
dc.contributor.authorNakamura, H.
dc.contributor.authorSawada, M.
dc.contributor.authorMidorikawa, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T09:26:13Z
dc.date.available2021-10-17T09:26:13Z
dc.date.issued2008
dc.identifier.issn1369-8001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14241
dc.source.beginpage310
dc.source.endpage313
dc.source.issue5_6
dc.source.journalMaterials Science in Semiconductor Processing
dc.source.volume11
dc.title

Effects of electron and proton radiation on embedded SiGe source/drain diodes

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles