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Charge trapping in very thin high-permittivity gate dielectric layers
Publication:
Charge trapping in very thin high-permittivity gate dielectric layers
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Stesmans, Andre
;
Naili, Mohamed
;
Heyns, Marc
Journal
Applied Physics Letters
Abstract
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1869
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1869
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations