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Impact of line-edge roughness on FinFET matching performance
Publication:
Impact of line-edge roughness on FinFET matching performance
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baravelli, Emanuele
;
Dixit, Abhisek
;
Rooyackers, Rita
;
Jurczak, Gosia
;
Speciale, Nicolo
;
De Meyer, Kristin
Journal
IEEE Trans. Electron Devices
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1901
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Acq. date: 2026-01-06
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Views
1901
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2026-01-06
Citations