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Recent trends in CMOS front-end reliability (tutorial)

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dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-19T14:40:34Z
dc.date.available2021-10-19T14:40:34Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19146
dc.source.conference17th Conference on Insulating Films on Semiconductors - INFOS
dc.source.conferencedate21/06/2011
dc.source.conferencelocationGrenoble France
dc.title

Recent trends in CMOS front-end reliability (tutorial)

dc.typeOral presentation
dspace.entity.typePublication
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