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Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface
Publication:
Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface
Date
2015
Journal article
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34985.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kotipalli, R.
;
Vermang, Bart
;
Joel, J.
;
Rajkumar, R.
;
Edoff, M.
;
Flandre, D.
Journal
AIP Advances
Abstract
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1899
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Metrics
Views
1899
since deposited on 2021-10-22
402
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations