Publication:
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance
| dc.contributor.author | Dey, Bappaditya | |
| dc.contributor.author | Anh Tuan Ngo | |
| dc.contributor.author | Sacchi, Sara | |
| dc.contributor.author | Blanco, Victor | |
| dc.contributor.author | Leray, Philippe | |
| dc.contributor.author | Halder, Sandip | |
| dc.contributor.imecauthor | Dey, Bappaditya | |
| dc.contributor.imecauthor | Sacchi, Sara | |
| dc.contributor.imecauthor | Blanco, Victor | |
| dc.contributor.imecauthor | Leray, Philippe | |
| dc.contributor.imecauthor | Halder, Sandip | |
| dc.contributor.orcidimec | Dey, Bappaditya::0000-0002-0886-137X | |
| dc.contributor.orcidimec | Sacchi, Sara::0000-0001-7486-6614 | |
| dc.contributor.orcidimec | Blanco, Victor::0000-0003-4308-0381 | |
| dc.contributor.orcidimec | Leray, Philippe::0000-0002-1086-270X | |
| dc.contributor.orcidimec | Halder, Sandip::0000-0002-6314-2685 | |
| dc.date.accessioned | 2025-04-13T04:30:51Z | |
| dc.date.available | 2025-04-13T04:30:51Z | |
| dc.date.issued | 2025 | |
| dc.identifier.doi | 10.1007/978-3-031-74640-6_36 | |
| dc.identifier.eisbn | 978-3-031-74640-6 | |
| dc.identifier.isbn | 978-3-031-74639-0 | |
| dc.identifier.issn | 1865-0929 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45526 | |
| dc.publisher | SPRINGER INTERNATIONAL PUBLISHING AG | |
| dc.source.beginpage | 435 | |
| dc.source.conference | 8th European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases | |
| dc.source.conferencedate | SEP 18-22, 2023 | |
| dc.source.conferencelocation | Turin | |
| dc.source.endpage | 453 | |
| dc.source.numberofpages | 19 | |
| dc.source.volume | 2136 | |
| dc.title | Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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