Publication:
Relation between Raman frequency and stress in Si for surface and cross-section experiments in microelectronics components
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1851 since deposited on 2021-10-22
3last month
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Acq. date: 2025-12-15
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Metrics
Views
1851 since deposited on 2021-10-22
3last month
1last week
Acq. date: 2025-12-15
Citations