Publication:
Relation between Raman frequency and stress in Si for surface and cross-section experiments in microelectronics components
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1847 since deposited on 2021-10-22
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Acq. date: 2025-10-25
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Views
1847 since deposited on 2021-10-22
420item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations