A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories

dc.contributor.author	Goux, Ludovic
dc.contributor.author	Hurkx, Fred
dc.contributor.author	Wang, Xin Peng
dc.contributor.author	Delhougne, Romain
dc.contributor.author	Attenborough, Karen
dc.contributor.author	Gravesteijn, Dirk
dc.contributor.author	Wouters, Dirk
dc.contributor.author	Perez Gonzalez, Jesus
dc.contributor.imecauthor	Goux, Ludovic
dc.contributor.imecauthor	Delhougne, Romain
dc.contributor.orcidimec	Goux, Ludovic::0000-0002-1276-2278
dc.date.accessioned	2021-10-18T16:40:26Z
dc.date.available	2021-10-18T16:40:26Z
dc.date.issued	2010
dc.identifier.issn	0741-3106
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/17176
dc.identifier.url	http://ieeexplore.ieee.org/search/freesearchresult.jsp?newsearch=true&queryText=2066953&filter=
dc.source.beginpage	1287
dc.source.endpage	1289
dc.source.issue	11
dc.source.journal	IEEE Electron Device Letters
dc.source.volume	31
dc.title	A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories
dc.type	Journal article
dspace.entity.type	Publication
Files
Publication available in collections:	Articles

Date