Enhanced sensitivity of silicon-on-insulator surface plasmon interferometer with additional silicon layer

dc.contributor.author	Le, Khai Q.
dc.contributor.author	Bienstman, Peter
dc.contributor.imecauthor	Bienstman, Peter
dc.contributor.orcidimec	Bienstman, Peter::0000-0001-6259-464X
dc.date.accessioned	2021-10-19T15:17:11Z
dc.date.available	2021-10-19T15:17:11Z
dc.date.embargo	9999-12-31
dc.date.issued	2011-06
dc.identifier.issn	1943-0655
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/19257
dc.source.beginpage	538
dc.source.endpage	545
dc.source.issue	3
dc.source.journal	IEEE Photonics Journal
dc.source.volume	3
dc.title	Enhanced sensitivity of silicon-on-insulator surface plasmon interferometer with additional silicon layer
dc.type	Journal article
dspace.entity.type	Publication
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