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Integrated fab process for metal oxide EUV photoresist
Publication:
Integrated fab process for metal oxide EUV photoresist
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Date
2015
Proceedings Paper
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33316.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grenville, Andrew
;
Anderson, Jeremy T.
;
Clark, Benjamin L.
;
De Schepper, Peter
;
Edson, Joseph
;
Greer, Michael
;
Kai, Jiang
;
Kocsis, Michael
;
Meyers, Stephen T.
;
Stowers, Jason K.
;
Telecky, Alan J.
;
De Simone, Danilo
;
Vandenberghe, Geert
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Acq. date: 2025-12-11
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Views
2094
since deposited on 2021-10-22
2
last month
1
last week
Acq. date: 2025-12-11
Citations