Publication:

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529388
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dc.contributor.authorSerbulova, Kateryna
dc.contributor.authorQiu, Zi-En
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorGrill, Alexander
dc.contributor.authorKao, Kuo-Hsing
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorSerbulova, Kateryna
dc.contributor.imecauthorQiu, Zi-En
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecSerbulova, Kateryna::0000-0001-7326-9949
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecDe Boeck, Jo::0000-0001-8244-1552
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2024-09-19T14:46:41Z
dc.date.available2024-08-16T18:28:03Z
dc.date.available2024-09-19T14:46:41Z
dc.date.issued2024
dc.description.wosFundingTextThis work was supported in part by imec's Industrial Affiliation Program on Quantum Computing and Cryoelectronics.
dc.identifier.doi10.1109/IRPS48228.2024.10529388
dc.identifier.eisbn979-8-3503-6976-2
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44311
dc.publisherIEEE
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
dc.source.numberofpages7
dc.subject.keywordsCMOS
dc.subject.keywordsBEHAVIOR
dc.title

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications

dc.typeProceedings paper
dspace.entity.typePublication
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