Publication:

Reliability study of power gallium nitride based transistors

Date

2011-06
Dissertation
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.department9f874554-fb77-4e62-9b9a-3dc4c677197d
cris.virtualsource.orcid9f874554-fb77-4e62-9b9a-3dc4c677197d
dc.contributor.advisorMertens, Robert Pierre
dc.contributor.authorMarcon, Denis
dc.contributor.imecauthorMarcon, Denis
dc.contributor.thesisadvisorMertens, Robert
dc.contributor.thesisadvisorBorghs, Gustaaf
dc.date.accessioned2021-10-19T16:01:00Z
dc.date.available2021-10-19T16:01:00Z
dc.date.issued2011-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19379
dc.title

Reliability study of power gallium nitride based transistors

dc.typePHD thesis
dspace.entity.typePublication
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