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Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks
Publication:
Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks
Date
2005-06
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhao, C.Z.
;
Zahid, Mohammed
;
Zhang, John
;
Groeseneken, Guido
;
Degraeve, Robin
;
De Gendt, Stefan
Journal
Microelectronic Engineering
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1912
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1912
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations