Publication:

Degradation of time dependent variability due to interface state generation

Date

2013
Proceedings Paper
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dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBina, Markus
dc.contributor.authorGrasser, Tibor
dc.contributor.authorCho, Moon Ju
dc.contributor.authorWeckx, Pieter
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-21T12:48:06Z
dc.date.available2021-10-21T12:48:06Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23176
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6576648&queryText%3DDegradation+of+time+dependent+variability+due
dc.source.beginpageT190
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate11/06/2013
dc.source.conferencelocationKyoto Japan
dc.source.endpageT191
dc.title

Degradation of time dependent variability due to interface state generation

dc.typeProceedings paper
dspace.entity.typePublication
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