Publication:
Significant reduction of positive bias temperature instability in high-k/metal-gate nFETs by incorporation of rare earth metals
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1761 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-06
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Views
1761 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-06
Citations