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Non-trivial GR and 1/f noise generated in the p-Si layer of SOI and SOS MOSFETs near the inverted front or buried p-Si/SiO2 interface

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1970 since deposited on 2021-10-14
Acq. date: 2025-10-23

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1970 since deposited on 2021-10-14
Acq. date: 2025-10-23

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