High temperature influence on analog parameters of bulk and SOI nFinFETs

dc.contributor.author	Oliveira, A.V.
dc.contributor.author	Agopian, P.G.D.
dc.contributor.author	Martino, J.A.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-22T21:28:20Z
dc.date.available	2021-10-22T21:28:20Z
dc.date.embargo	9999-12-31
dc.date.issued	2015
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/25705
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063831
dc.source.beginpage	293
dc.source.conference	Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate	26/01/2015
dc.source.conferencelocation	Bologna Italy
dc.source.endpage	296
dc.title	High temperature influence on analog parameters of bulk and SOI nFinFETs
dc.type	Proceedings paper
dspace.entity.type	Publication
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