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Characterization of the thermal impact of Cu-Cu bonds achieved using TSVs on hot spot dissipation in 3D stacked ICs
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Characterization of the thermal impact of Cu-Cu bonds achieved using TSVs on hot spot dissipation in 3D stacked ICs
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Oprins, Herman
;
Cherman, Vladimir
;
Vandevelde, Bart
;
Torregiani, Cristina
;
Stucchi, Michele
;
Van der Plas, Geert
;
Marchal, Pol
;
Beyne, Eric
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1923
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Acq. date: 2026-07-27
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Statistics
Views
1923
since deposited on 2021-10-19
1
last month
Acq. date: 2026-07-27
Citations