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Unraveling Reverse Bias Induced Degradation Pathways in Perovskite Solar Cells and Modules

 
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cris.virtual.orcid0000-0002-9221-4932
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dc.contributor.authorVishwanathreddy, Sujith
dc.contributor.authorRamesh, Santhosh
dc.contributor.authorAguirre, Aranzazu
dc.contributor.authorAernouts, Tom
dc.contributor.authorPoortmans, Jef
dc.contributor.authorDaenen, Michaël
dc.date.accessioned2026-07-29T09:24:35Z
dc.date.available2026-07-29T09:24:35Z
dc.date.createdwos2026-02-04
dc.date.issued2026
dc.description.abstractPerovskite solar cells have surged ahead in efficiency, yet their long-term stability continues to pose significant hurdles. A stressor that remains largely underexplored is the impact of reverse bias voltage. Reverse bias voltages are caused by current mismatches in series-connected cells, often from partial shading. In this study, we examine how measurement conditions, device architecture, and upscaling to modules influence this phenomenon. Through characterization, we reveal that ion migration and shunting are key drivers of performance loss. Our findings highlight the need for standardized testing protocols and propose reverse bias as a useful method for understanding accelerated degradation.
dc.description.wosFundingTextThis work was supported by the European Union through the TESTARE project (Grant ID: 101079488) and LAPERITIVO project (Grant ID: 101147311).
dc.identifier.doi10.1021/acsaem.5c03834
dc.identifier.issn2574-0962
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/60058
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherAMER CHEMICAL SOC
dc.source.beginpage1354
dc.source.endpage1360
dc.source.issue3
dc.source.journalACS APPLIED ENERGY MATERIALS
dc.source.numberofpages7
dc.source.volume9
dc.subject.keywordsSTABILITY
dc.title

Unraveling Reverse Bias Induced Degradation Pathways in Perovskite Solar Cells and Modules

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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