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Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors
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Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors
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Date
1997
Proceedings Paper
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2104.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sercu, Stefaan
;
Martens, Luc
Journal
Abstract
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1875
since deposited on 2021-09-30
Acq. date: 2025-12-13
Citations
Metrics
Views
1875
since deposited on 2021-09-30
Acq. date: 2025-12-13
Citations