Publication:
Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT
Date
| dc.contributor.author | Piontek, Andreas | |
| dc.contributor.author | Choi, Li Jen | |
| dc.contributor.author | Van Huylenbroeck, Stefaan | |
| dc.contributor.author | Vanhoucke, Tony | |
| dc.contributor.author | Hijzen, Erwin | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Van Huylenbroeck, Stefaan | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Van Huylenbroeck, Stefaan::0000-0001-9978-3575 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2021-10-16T04:05:46Z | |
| dc.date.available | 2021-10-16T04:05:46Z | |
| dc.date.issued | 2005-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11021 | |
| dc.source.beginpage | 62 | |
| dc.source.conference | International Conference on Silicon Epitaxy and Heterostructures - ICSI | |
| dc.source.conferencedate | 23/05/2005 | |
| dc.source.conferencelocation | Awaji Island Japan | |
| dc.source.endpage | 63 | |
| dc.title | Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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