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Angular and strain dependence of heavy-ions induced degration in SOI FinFETs

Date

2010
Journal article
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dc.contributor.authorGriffoni, Alessio
dc.contributor.authorGerardin, Simone
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorPaccagnella, Alessandro
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T16:44:21Z
dc.date.available2021-10-18T16:44:21Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17190
dc.source.beginpage1924
dc.source.endpage1932
dc.source.issue4
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.volume57
dc.title

Angular and strain dependence of heavy-ions induced degration in SOI FinFETs

dc.typeJournal article
dspace.entity.typePublication
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