Publication:
Defect distribution in InP epitaxially grown in nano-trenches on off-axis Si substrates
Date
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Richard, Olivier | |
| dc.contributor.author | Jiang, Sijia | |
| dc.contributor.author | Merckling, Clement | |
| dc.contributor.author | Loo, Roger | |
| dc.contributor.author | Caymax, Matty | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.imecauthor | Richard, Olivier | |
| dc.contributor.imecauthor | Merckling, Clement | |
| dc.contributor.imecauthor | Loo, Roger | |
| dc.contributor.imecauthor | Caymax, Matty | |
| dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
| dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
| dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
| dc.date.accessioned | 2021-10-20T10:05:31Z | |
| dc.date.available | 2021-10-20T10:05:31Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20354 | |
| dc.source.conference | 15th European Microscopy Congress | |
| dc.source.conferencedate | 16/09/2012 | |
| dc.source.conferencelocation | Cambridge UK | |
| dc.title | Defect distribution in InP epitaxially grown in nano-trenches on off-axis Si substrates | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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