Publication:
Creating options for 3D-SIC testing
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-21T09:50:55Z | |
| dc.date.available | 2021-10-21T09:50:55Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22770 | |
| dc.source.conference | IEEE Symposium on Design & Diagnostics of Electronic Circuits & Systems - DDECS | |
| dc.source.conferencedate | 8/04/2013 | |
| dc.source.conferencelocation | Karlovy Vary Czech Republic | |
| dc.title | Creating options for 3D-SIC testing | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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