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Combining TOF-SIMS with XPS to quantify organic surface coverages
Publication:
Combining TOF-SIMS with XPS to quantify organic surface coverages
Date
2000
Proceedings Paper
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4461.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kenens, Conny
;
Conard, Thierry
;
Hellemans, L.
;
Bertrand, P.
;
Vandervorst, Wilfried
Journal
Abstract
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1986
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1986
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations