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Cleaning of metal gate stacks for the sub 90nm technology node

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dc.contributor.authorKraus, Harald
dc.contributor.authorVermeyen, Kenneth
dc.contributor.authorSnow, Jim
dc.contributor.authorFyen, Wim
dc.contributor.authorMertens, Paul
dc.contributor.authorKovacs, Frederic
dc.contributor.imecauthorMertens, Paul
dc.date.accessioned2021-10-15T05:14:10Z
dc.date.available2021-10-15T05:14:10Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7756
dc.source.conference204th Meeting of the Electrochemical Society: 8th Int. Symp. on CLeaning Technology in Semiconductor Device Manufacturing
dc.source.conferencedate12/10/2003
dc.source.conferencelocationOrlando, FL USA
dc.title

Cleaning of metal gate stacks for the sub 90nm technology node

dc.typeMeeting abstract
dspace.entity.typePublication
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