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Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities
Publication:
Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities
Date
2013
Journal article
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27423.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Aoulaiche, Marc
;
dos Santos, Sara
;
Martino, Joao
;
Strobel, Vincent
;
Cretu, Bogdan
;
Routoure, J.M.
;
Carin, Regis
;
Luque Rodriguez, Abraham
;
Jimenez Tejada, Juan Antonio
;
Claeys, Cor
Journal
ECS Journal of Solid State Science and Technology
Abstract
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1914
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations
Metrics
Views
1914
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations