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Systematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modules

Date

2005-03
Proceedings Paper
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dc.contributor.authorWang, Hua
dc.contributor.authorMiranda, Miguel
dc.contributor.authorDehaene, Wim
dc.contributor.authorCatthoor, Francky
dc.contributor.authorMaex, Karen
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorMaex, Karen
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-16T07:01:09Z
dc.date.available2021-10-16T07:01:09Z
dc.date.issued2005-03
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11538
dc.source.beginpage914
dc.source.conferenceProceedings of the Design, Automation and Test in Europe Conference and Exhibition - DATE
dc.source.conferencedate7/03/2005
dc.source.conferencelocationMünchen Germany
dc.source.endpage919
dc.title

Systematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modules

dc.typeProceedings paper
dspace.entity.typePublication
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