Publication:
Defect inspection of Cu metallization
Date
| dc.contributor.author | Holsteyns, Frank | |
| dc.contributor.author | Carbonell, Laure | |
| dc.contributor.author | Vos, Ingrid | |
| dc.contributor.author | Vrancken, Evi | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Mertens, Paul | |
| dc.contributor.imecauthor | Holsteyns, Frank | |
| dc.contributor.imecauthor | Vos, Ingrid | |
| dc.contributor.imecauthor | Vrancken, Evi | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.contributor.imecauthor | Mertens, Paul | |
| dc.contributor.orcidimec | Vos, Ingrid::0000-0002-1746-2004 | |
| dc.date.accessioned | 2021-10-14T21:49:07Z | |
| dc.date.available | 2021-10-14T21:49:07Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6401 | |
| dc.source.conference | KLA-Tencor Yield Management Seminar | |
| dc.source.conferencedate | 17/04/2002 | |
| dc.source.conferencelocation | München Germany | |
| dc.title | Defect inspection of Cu metallization | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |