Publication:

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging

Date

2018
Meeting abstract
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dc.contributor.authorSchulze, Andreas
dc.contributor.authorHan, Han
dc.contributor.authorStrykos, Libor
dc.contributor.authorVystavel, Thomas
dc.contributor.authorPorret, Clément
dc.contributor.authorLoo, Roger
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorHan, Han
dc.contributor.imecauthorPorret, Clément
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecHan, Han::0000-0003-2169-8332
dc.contributor.orcidimecPorret, Clément::0000-0002-4561-348X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-26T03:32:03Z
dc.date.available2021-10-26T03:32:03Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31748
dc.identifier.urlhttp://ma.ecsdl.org/content/MA2018-02/31/1069.abstract
dc.source.beginpage1069
dc.source.conferenceECS AiMES 2018 Meeting
dc.source.conferencedate30/09/2018
dc.source.conferencelocationCancun Mexico
dc.title

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging

dc.typeMeeting abstract
dspace.entity.typePublication
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