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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Date

2013
Meeting abstract
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dc.contributor.authorFleischmann, Claudia
dc.contributor.authorConard, Thierry
dc.contributor.authorHavelund, R.
dc.contributor.authorFranquet, Alexis
dc.contributor.authorPoleunis, C.
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorDelcorte, A.
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.date.accessioned2021-10-21T07:38:36Z
dc.date.available2021-10-21T07:38:36Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22350
dc.source.conference19th International Conference on Secondary Ion Mass Spectrometry
dc.source.conferencedate29/09/2013
dc.source.conferencelocationJeju Korea
dc.title

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

dc.typeMeeting abstract
dspace.entity.typePublication
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