Publication:
Impact of stress on MOS devices
Date
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.date.accessioned | 2021-10-25T18:29:45Z | |
| dc.date.available | 2021-10-25T18:29:45Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30680 | |
| dc.source.conference | European Conference on Residual Stresses - ECRS10 | |
| dc.source.conferencedate | 10/09/2018 | |
| dc.source.conferencelocation | Leuven Belgium | |
| dc.title | Impact of stress on MOS devices | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |