Publication:

Dimensioning for power and performance under 10nm: The limits of FinFETs scaling

Date

2015
Proceedings Paper
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dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorJang, Doyoung
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.accessioned2021-10-22T19:18:30Z
dc.date.available2021-10-22T19:18:30Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25286
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7165883
dc.source.beginpage1
dc.source.conference2015 International Conference on IC Design & Technology (ICICDT)
dc.source.conferencedate1/06/2015
dc.source.conferencelocationLeuven Belgium
dc.source.endpage4
dc.title

Dimensioning for power and performance under 10nm: The limits of FinFETs scaling

dc.typeProceedings paper
dspace.entity.typePublication
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