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Application of fully fluorinated cyclic saturated hydrocarbons for highly selective nanoscale silicon dioxide reactive ion etching

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dc.contributor.authorYanovich, S.
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorOrlov, S.
dc.contributor.authorGushchin, O.
dc.contributor.authorZaitsev, N.
dc.contributor.authorIgnatov, P.
dc.contributor.authorYafarov, R.
dc.date.accessioned2021-10-20T19:13:08Z
dc.date.available2021-10-20T19:13:08Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21877
dc.source.conferencePlasma Etch and Strip in Microelectronics - PESM
dc.source.conferencedate15/03/2012
dc.source.conferencelocationGrenoble France
dc.title

Application of fully fluorinated cyclic saturated hydrocarbons for highly selective nanoscale silicon dioxide reactive ion etching

dc.typeMeeting abstract
dspace.entity.typePublication
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