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100nm generation contact patterning by low temperature 193nm resist reflow process

Date

 
dc.contributor.authorVan Driessche, V.
dc.contributor.authorGrozev, G.
dc.contributor.authorLucas, K.
dc.contributor.authorVan Roey, Frieda
dc.contributor.authorTzviatkov, Plamen
dc.contributor.imecauthorVan Roey, Frieda
dc.date.accessioned2021-10-14T23:33:39Z
dc.date.available2021-10-14T23:33:39Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6933
dc.source.beginpage?
dc.source.endpage?
dc.source.issue16
dc.source.journalSemiconductor Fabtech
dc.title

100nm generation contact patterning by low temperature 193nm resist reflow process

dc.typeJournal article
dspace.entity.typePublication
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