Publication:

Microstructure evolution effects of helium redistribution in as-implanted silicon and Si0.8Ge0.2/Si heterostructures

Date

 
dc.contributor.authorMorschbacher, M.J.
dc.contributor.authorda Silva, D.L.
dc.contributor.authorFichtner, P.F.P.
dc.contributor.authorOliviero, E.
dc.contributor.authorBehar, M.
dc.contributor.authorZawislak, F.C.
dc.contributor.authorHollander, B.
dc.contributor.authorLuysberg, M.
dc.contributor.authorMantl, S.
dc.contributor.authorLoo, Roger
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-15T14:59:01Z
dc.date.available2021-10-15T14:59:01Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9323
dc.source.beginpage703
dc.source.endpage707
dc.source.journalNuclear Instruments & Methods in Physics Research B
dc.source.volume219-220
dc.title

Microstructure evolution effects of helium redistribution in as-implanted silicon and Si0.8Ge0.2/Si heterostructures

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: