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An ionic polymer route to a stable unpinning of the Fermi level of highly doped graphene

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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.department157387e8-9779-46ad-8c69-d039e22250c5
cris.virtualsource.orcid157387e8-9779-46ad-8c69-d039e22250c5
dc.contributor.authorPradeepkumar, A.
dc.contributor.authorYang, Y.
dc.contributor.authorCastaneda, E.
dc.contributor.authorAngel, F. A.
dc.contributor.authorIacopi, Francesca
dc.date.accessioned2025-06-26T03:59:34Z
dc.date.available2025-06-26T03:59:34Z
dc.date.issued2025
dc.description.abstractEpitaxial graphene on cubic silicon carbide on silicon could enable unique optical metasurface devices seamlessly integrated with CMOS technologies. However, one of the most promising methods to obtain large-scale epitaxial graphene on this challenging system typically leads to a highly p-type-doped graphene with a Fermi level pinned at ∼0.55 eV below the Dirac point. Hence, the use of conventional gate dielectric materials such as SiO2 and Si3N4 precludes the tuning of the graphene carrier concentration. We demonstrate that this limitation can be overcome with the use of polyethyleneimine (PEI) as a gate dielectric material for graphene field-effect transistors. We achieve significant tuning of the graphene's Fermi level, enabling ambipolar operation exceeding a 3 eV window. In addition, we demonstrate that excellent stability of the PEI-based devices can be achieved, thanks to the addition of a thin protective oxide film. These findings highlight the potential of ionic polymers for advancing reconfigurable graphene-based devices for photonic applications.
dc.description.wosFundingTextThe authors acknowledge funding from the ARC Centre of Excellence in Transformative Meta-Optical Systems (No. CE200100010). This work was partly performed at the research prototype foundry, an Australian National Fabrication Facility at the Sydney Nanoscience Hub. The authors acknowledge facilities and the technical assistance during the device fabrication. The authors thank Professor Juan Francisco Armijo for access to the scanning electrochemical workstation, funded by project FONDEQUIP EQM150016. They thank Bryan Schwitter from Altum RF for the assistance with the RF transistor design and Meisam Esfandiari for the RF simulations in the CST Microwave Studio.
dc.identifier.doi10.1063/5.0271357
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45845
dc.publisherAIP Publishing
dc.source.beginpage224303
dc.source.issue22
dc.source.journalJOURNAL OF APPLIED PHYSICS
dc.source.numberofpages8
dc.source.volume137
dc.subject.keywordsFIELD-EFFECT TRANSISTORS
dc.subject.keywordsPERFORMANCE
dc.subject.keywordsSILICON
dc.title

An ionic polymer route to a stable unpinning of the Fermi level of highly doped graphene

dc.typeJournal article
dspace.entity.typePublication
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