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Impact of line width roughness on the matching performances of next-generation devices
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Impact of line width roughness on the matching performances of next-generation devices
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gustin, Cedric
;
Leunissen, Peter
;
Mercha, Abdelkarim
;
Decoutere, Stefaan
;
Lorusso, Gian
Journal
Thin Solid Films
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1821
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations
Metrics
Views
1821
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations