Publication:
Model for the trap-assisted tunnelling current through very thin SiO2/ZrO2 gate dielectric stacks
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1848 since deposited on 2021-10-14
2last month
Acq. date: 2025-12-17
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Views
1848 since deposited on 2021-10-14
2last month
Acq. date: 2025-12-17
Citations