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Interface quality of atomic layer deposited La-doped ZrO2 films on Ge-passivated In0.15Ga0.85As substrates
Publication:
Interface quality of atomic layer deposited La-doped ZrO2 films on Ge-passivated In0.15Ga0.85As substrates
Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Molle, Alessandro
;
Brammertz, Guy
;
Lamagna, Luca
;
Spiga, Sabina
;
Meuris, Marc
;
Fanciulli, Marco
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1920
since deposited on 2021-10-18
Acq. date: 2025-10-29
Citations
Metrics
Views
1920
since deposited on 2021-10-18
Acq. date: 2025-10-29
Citations