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Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
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Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sahhaf, Sahar
;
Degraeve, Robin
;
Srividya, Vidya
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Groeseneken, Guido
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1939
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
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Metrics
Views
1939
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations