Publication:
Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
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1945 since deposited on 2021-10-18
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Acq. date: 2026-08-07
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1945 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-08-07
Citations