Current transient spectroscopy for trapping analysis on Au-free AlGaN/GaN Schottky barrier diode

dc.contributor.author	Hu, Jie
dc.contributor.author	Stoffels, Steve
dc.contributor.author	Lenci, Silvia
dc.contributor.author	Bakeroot, Benoit
dc.contributor.author	Venegas, Rafael
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	Decoutere, Stefaan
dc.contributor.imecauthor	Stoffels, Steve
dc.contributor.imecauthor	Lenci, Silvia
dc.contributor.imecauthor	Bakeroot, Benoit
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Bakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimec	Groeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned	2021-10-22T19:45:59Z
dc.date.available	2021-10-22T19:45:59Z
dc.date.issued	2015
dc.identifier.issn	0003-6951
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/25398
dc.identifier.url	http://dx.doi.org/10.1063/1.4913575
dc.source.beginpage	83502
dc.source.issue	8
dc.source.journal	Applied Physics Letters
dc.source.volume	106
dc.title	Current transient spectroscopy for trapping analysis on Au-free AlGaN/GaN Schottky barrier diode
dc.type	Journal article
dspace.entity.type	Publication
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