Publication:

HAXPES of GaN film on Si with Cr K alpha photons

Date

2021
Journal article
https://doi.org/10.1116/6.0000888
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dc.contributor.authorVanleenhove, Anja
dc.contributor.authorZborowski, Charlotte
dc.contributor.authorVaesen, Inge
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorConard, Thierry
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorZborowski, Charlotte
dc.contributor.imecauthorVaesen, Inge
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorConard, Thierry
dc.contributor.orcidimecZborowski, Charlotte::0000-0001-6276-7109
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.accessioned2022-01-31T11:29:38Z
dc.date.available2021-11-02T15:57:38Z
dc.date.available2022-01-31T11:29:38Z
dc.date.issued2021
dc.identifier.doi10.1116/6.0000888
dc.identifier.issn1055-5269
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37623
dc.publisherAMER INST PHYSICS
dc.source.issue1
dc.source.journalSURFACE SCIENCE SPECTRA
dc.source.numberofpages9
dc.source.volume28
dc.subject.keywordsANGULAR-DISTRIBUTION PARAMETERS
dc.subject.keywordsANALYTIC FITS
dc.title

HAXPES of GaN film on Si with Cr K alpha photons

dc.typeJournal article
dspace.entity.typePublication
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