Publication:

Low-frequency noise sources related to processing-induced extended defects in Si devices

Date

1996
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T15:26:51Z
dc.date.available2021-09-29T15:26:51Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1495
dc.source.beginpage403
dc.source.conferenceProceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST'95
dc.source.conferencedate2/09/1995
dc.source.conferencelocationBerlin Germany
dc.source.endpage408
dc.title

Low-frequency noise sources related to processing-induced extended defects in Si devices

dc.typeProceedings paper
dspace.entity.typePublication
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