Publication:
Learning-based defect inspection of µLED patterns using reflection-mode Fourier ptychographic microscopy
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0001-9577-4567 | |
| cris.virtual.orcid | 0000-0003-0908-1655 | |
| cris.virtual.orcid | 0000-0003-1006-1838 | |
| cris.virtualsource.department | 96341151-af55-4355-8e8c-7f07de21e4fe | |
| cris.virtualsource.department | 8722db29-0da3-40ce-9be7-3317c87c8a92 | |
| cris.virtualsource.department | 8916b106-a388-4b3a-a602-36138802b449 | |
| cris.virtualsource.orcid | 96341151-af55-4355-8e8c-7f07de21e4fe | |
| cris.virtualsource.orcid | 8722db29-0da3-40ce-9be7-3317c87c8a92 | |
| cris.virtualsource.orcid | 8916b106-a388-4b3a-a602-36138802b449 | |
| dc.contributor.author | Mahmoudpour, Saeed | |
| dc.contributor.author | Sake, Balaji | |
| dc.contributor.author | Velasco, Daniel Arribas | |
| dc.contributor.author | Sung, Minsik | |
| dc.contributor.author | Choi, Jun-Kyu | |
| dc.contributor.author | Schelkens, Peter | |
| dc.contributor.author | Kim, Hyun-Su | |
| dc.date.accessioned | 2026-09-07T13:53:21Z | |
| dc.date.available | 2026-09-07T13:53:21Z | |
| dc.date.createdwos | 2026 | |
| dc.date.issued | 2026 | |
| dc.description.wosFundingText | Korea Institute for Advancement of Technology (KIAT) , Korean Government (MOTIE) (P146500071). | |
| dc.identifier.doi | 10.1364/ao.599473 | |
| dc.identifier.issn | 1559-128X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/60232 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | Optica Publishing Group | |
| dc.source.beginpage | 5836 | |
| dc.source.endpage | 5851 | |
| dc.source.issue | 17 | |
| dc.source.journal | APPLIED OPTICS | |
| dc.source.numberofpages | 16 | |
| dc.source.volume | 65 | |
| dc.subject.keywords | CONVOLUTIONAL NEURAL-NETWORK | |
| dc.subject.keywords | LEDS | |
| dc.title | Learning-based defect inspection of µLED patterns using reflection-mode Fourier ptychographic microscopy | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-07-14 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-07-14 | |
| Files | Original bundle
| |
| Publication available in collections: |